近日,西安電子科技大學郝躍院士團隊張進成教授、張金風教授研究組在超寬禁帶半導體金剛石功率(lv)器件(jian)方(fang)向取得重(zhong)要(yao)(yao)進展(zhan)。在(zai)國(guo)際知名期刊《IEEE Electron Device Letters》上發表(biao)了(le)(le)題(ti)為“Integration of Oxidized Silicon- and Hydrogen-terminated Diamond p-channels for Normally-off High-voltage Diamond Power Devices”的(de)最新研究(jiu)成果,西電(dian)為第一(yi)完成單(dan)位(wei),團(tuan)隊(dui)博士后(hou)付裕為本文(wen)第一(yi)作者(zhe)。該研究(jiu)將硅終(zhong)端(duan)(duan)和氫終(zhong)端(duan)(duan)金剛石的(de)優勢(shi)相結(jie)合(he),提出(chu)采用(yong)硅/氫終(zhong)端(duan)(duan)金剛石復合(he)導電(dian)通道的(de)增強型金剛石高(gao)壓場效應(ying)管(guan)新結(jie)構,器件(jian)實現(xian)了(le)(le)高(gao)閾值電(dian)壓(-8.6 V)和高(gao)擊(ji)穿電(dian)壓(-1376 V)的(de)優異性能,為下一(yi)代高(gao)耐壓、高(gao)效率(lv)電(dian)力電(dian)子系統提供(gong)了(le)(le)重(zhong)要(yao)(yao)技術路(lu)徑。
金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)是(shi)超(chao)寬禁(jin)帶半導(dao)體(ti)的典型(xing)代表(biao),具有(you)禁(jin)帶寬度(du)大(5.5 eV)、擊(ji)穿場強高(gao)(13 MV/cm)、熱(re)導(dao)率高(gao)(22 W·cm-1·K-1)等(deng)(deng)優點,在高(gao)壓、大功率、高(gao)溫、極端(duan)(duan)環境(jing)電子器件(jian)及探測(ce)器應用中具有(you)顯(xian)著優勢,也(ye)被譽為“終(zhong)極半導(dao)體(ti)”材料(liao),成為國內(nei)外爭相布局的研(yan)究熱(re)點。金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)在不(bu)同的表(biao)面(mian)(mian)終(zhong)端(duan)(duan)條(tiao)件(jian)下,表(biao)面(mian)(mian)的物理(li)和電學性(xing)質(zhi)會發生顯(xian)著的變化(hua),其中氫(qing)終(zhong)端(duan)(duan)和硅(gui)終(zhong)端(duan)(duan)金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)都(dou)可形成表(biao)面(mian)(mian)p型(xing)電導(dao)(二維空(kong)穴氣2DHG),分別具有(you)載流子濃度(du)高(gao)和介質(zhi)膜/金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)界(jie)面(mian)(mian)質(zhi)量(liang)好等(deng)(deng)特點。經過(guo)多(duo)年的發展,基于二維空(kong)穴氣表(biao)面(mian)(mian)溝(gou)(gou)道(dao)的耗盡(jin)型(xing)氫(qing)終(zhong)端(duan)(duan)金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)MOSFET器件(jian)性(xing)能取得了長足進步;通過(guo)對氫(qing)終(zhong)端(duan)(duan)金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)MOSFET的柵下溝(gou)(gou)道(dao)或(huo)柵介質(zhi)進行特殊處理(li),器件(jian)也(ye)可實(shi)現增(zeng)強型(xing)工作(zuo)模式。然而,現有(you)增(zeng)強型(xing)金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)場效應管(guan)的溝(gou)(gou)道(dao)性(xing)能不(bu)夠理(li)想,存在界(jie)面(mian)(mian)電荷調控難度(du)大等(deng)(deng)問題(ti),導(dao)致(zhi)器件(jian)閾值電壓絕對值較低,嚴重阻礙了高(gao)性(xing)能金(jin)(jin)(jin)剛(gang)(gang)石(shi)(shi)功率器件(jian)的發展。
近年來,硅(gui)(gui)(gui)(gui)終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)技(ji)術受到高度關注:表面(mian)(mian)碳–硅(gui)(gui)(gui)(gui)鍵能(neng)夠基本維(wei)持金(jin)(jin)(jin)剛(gang)(gang)石(shi)的(de)sp3結構,界面(mian)(mian)質(zhi)量(liang)優異;氧(yang)化(hua)后硅(gui)(gui)(gui)(gui)終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)表面(mian)(mian)的(de)電導(dao)(dao)率降低(di),有(you)利(li)于實現高閾值電壓(ya)增(zeng)強型器(qi)件。受此啟發,研究團隊(dui)創新(xin)性地將氫終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)的(de)高電導(dao)(dao)特性和硅(gui)(gui)(gui)(gui)終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)的(de)高界面(mian)(mian)質(zhi)量(liang)特性優勢相結合(he),提出將硅(gui)(gui)(gui)(gui)終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)作(zuo)為柵(zha)(zha)控溝道(dao)、將氫終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)作(zuo)為柵(zha)(zha)源通(tong)道(dao)區與柵(zha)(zha)漏漂移區的(de)器(qi)件新(xin)結構,突破了增(zeng)強型金(jin)(jin)(jin)剛(gang)(gang)石(shi)場效應管的(de)低(di)閾值電壓(ya)和耐壓(ya)瓶頸。器(qi)件工藝采用先制備高質(zhi)量(liang)硅(gui)(gui)(gui)(gui)終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)、再利(li)用低(di)損傷刻蝕和氫化(hua)工藝制備氫終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)的(de)技(ji)術方案,并且通(tong)過(guo)版圖設計在(zai)同一襯底上制備了硅(gui)(gui)(gui)(gui)/氫復合(he)終(zhong)(zhong)(zhong)端,和單一氫終(zhong)(zhong)(zhong)端金(jin)(jin)(jin)剛(gang)(gang)石(shi)器(qi)件作(zuo)了對比(bi)。

實驗結果(guo)表(biao)明,氫終(zhong)端(duan)金剛石(shi)結構的(de)表(biao)面粗糙(cao)度僅(jin)為1.05 nm,保(bao)證了(le)器件(jian)(jian)漂(piao)移(yi)區的(de)載流子(zi)傳輸(shu)效率。此(ci)外,器件(jian)(jian)在寬(kuan)達50 V的(de)柵壓(ya)擺幅范圍內(nei)(nei)保(bao)持(chi)低于(yu)10 mA/mm的(de)漏(lou)極電(dian)流與柵極泄漏(lou)電(dian)流,開關(guan)比超過10 ,展(zhan)現出優異的(de)開關(guan)特(te)性(xing)。最(zui)終(zhong),器件(jian)(jian)實現了(le)高達-8.6 V的(de)高閾值電(dian)壓(ya),并具備-1376 V的(de)關(guan)態(tai)擊穿(chuan)(chuan)電(dian)壓(ya),擊穿(chuan)(chuan)場(chang)強(qiang)達到1.2 MV/cm,指標(biao)優于(yu)國(guo)內(nei)(nei)外同類器件(jian)(jian)水平。這一結果(guo)是(shi)國(guo)際(ji)上硅終(zhong)端(duan)溝道金剛石(shi)器件(jian)(jian)高壓(ya)特(te)性(xing)的(de)第一次(ci)報道,其kV級擊穿(chuan)(chuan)電(dian)壓(ya)具有里程碑式意(yi)義,為該類器件(jian)(jian)在未來高壓(ya)大功(gong)率系統中的(de)應(ying)用奠定了(le)基礎。


該(gai)研究(jiu)得到國(guo)家(jia)重點(dian)研發計(ji)劃項(xiang)目(mu)、國(guo)家(jia)自然科學基(ji)金創新群體(ti)/杰(jie)青/重點(dian)項(xiang)目(mu)、中國(guo)博士(shi)后基(ji)金項(xiang)目(mu)等(deng)的(de)資助(zhu)。


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